SWIR Imaging at Machine Vision Resolution and Cost
Onsemi SWIR Vision Systems developed CQD cameras using Colloidal Quantum Dot sensor technology — a fundamentally different approach to shortwave infrared imaging that overcomes the resolution and cost constraints of traditional InGaAs sensors.
SWIR wavelengths (900–2000 nm) pass through materials that block visible light — including plastics, silicon and certain packaging — enabling inspection tasks impossible with conventional RGB or NIR cameras. Content verification through packaging, subsurface defect detection and electrode alignment in EV battery manufacturing are among the key applications.
Onsemi SWIR Vision Systems cameras are specified when inspection requires imaging through opaque materials, detecting moisture, identifying chemical composition, or resolving fine features in spectral ranges beyond silicon sensor sensitivity.
Onsemi CQD Camera Capabilities
CQD SWIR Sensors
Colloidal Quantum Dot (CQD) technology delivers high-resolution SWIR imaging at a fraction of traditional InGaAs sensor cost — enabling SWIR to be deployed at scale in industrial machine vision.
High-Resolution Infrared Imaging
Onsemi CQD cameras provide megapixel-class SWIR imaging, overcoming the resolution limitations of conventional InGaAs sensors for fine-detail defect inspection.
High Frame Rate Operation
Programmable frame time and exposure control support high-speed inline inspection, with internal clock or external TTL hardware trigger for multi-tool synchronisation.
Through-Packaging Inspection
SWIR wavelengths penetrate plastics, films and opaque packaging — enabling non-destructive content inspection, fill-level verification and foreign object detection through packaging.
EV Battery Inspection
SWIR imaging supports lithium-ion battery production by verifying anode and cathode alignment, electrode coating uniformity and particle integrity at production speed.
GenICam Compliant Integration
Fully GenICam-compliant cameras with demonstrated compatibility with Cognex VisionPro, Matrox and standard machine vision software platforms.
Typical Application Areas
Pharmaceutical Vial & Fill Level Inspection
SWIR imaging sees through opaque plastic labels and packaging to verify fluid levels, content integrity and foreign body contamination in pharmaceutical vials.
Learn moreEV Battery Production & Electrode Inspection
Verify anode/cathode alignment, coating uniformity and detect electrode defects during lithium-ion battery manufacturing to improve safety and energy density.
Learn moreFood Packaging Content Inspection
Detect contaminants, verify fill levels and inspect product integrity through opaque food packaging without opening or destroying the package.
Learn morePlastic Packaging Defect Detection
SWIR reveals structural defects, wall thickness variations and contamination in plastic packaging components invisible to RGB or NIR imaging.
Learn moreSilicon Wafer & Semiconductor Inspection
Inspect silicon substrates and semiconductor wafers through the material using SWIR transmittance — detecting subsurface defects and inclusions.
Learn moreLaser Beam Profiling
Characterise near-IR and SWIR laser beam profiles for alignment, mode analysis and process verification in photonics and materials processing.
Learn moreOnsemi CQD Camera Series
Onsemi SWIR
640 x 512 / 1280 x 1040 / 1920 x 1080
High-resolution CQD SWIR cameras with USB3 Vision or GigE Vision interfaces
Onsemi CQD eSWIR
640 x 512 / 1280 x 1040
Extended SWIR cameras covering UV to SWIR for broadband spectral imaging
Onsemi Laser Profiling
640 x 512 / 1280 x 1040
Specialised for laser beam profiling with large sensor area and low angular sensitivity
Technology Tags
Supporting System Integrators & OEM Machine Builders
Laser 2000 supplies Onsemi SWIR Vision Systems CQD cameras as part of advanced inspection platforms requiring shortwave infrared imaging capability.
We support system integrators and OEM machine builders in specifying SWIR imaging solutions — advising on spectral range selection, lens compatibility, illumination requirements and software integration to ensure the camera delivers the required inspection performance within the system architecture.
Our role is to ensure Onsemi SWIR Vision cameras are correctly matched to the application — covering sensor sensitivity range, frame rate requirements, triggering architecture and integration with machine vision software platforms.
Core Imaging Techniques
SWIR Imaging
Short-wave infrared imaging for material identification and through-packaging inspection.
Learn MoreSpectral & Wavelength Imaging
Imaging beyond the visible spectrum for material classification.
Learn MoreDefect & Anomaly Detection
Reveal subsurface defects and contamination invisible to RGB cameras.
Learn More